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1

On the Circuit Complexity of Sigmoid Feedforward Neural Networks

Valeriu Beiu, John G. Taylor

Journal:

Neural Networks

Year:

1996

Language:

english

File:

PDF, 1.92 MB

english, 1996

2

Ensuring the safety and health of workers performing work at heights in the industrial sectors

Antonov, Anca Elena, BuicÄ, Georgeta, Beiu, Constantin, Pasculescu, V.M.

Journal:

MATEC Web of Conferences

Year:

2020

File:

PDF, 582 KB

2020

3

Majority MultiplexingâEconomical Redundant Fault-Tolerant Designs for Nanoarchitectures

Roy, S., Beiu, V.

Journal:

IEEE Transactions on Nanotechnology

Year:

2005

Language:

english

File:

PDF, 1.02 MB

english, 2005

4

A Constructive Approach to Calculating Lower Entropy Bounds

Valeriu Beiu, Sorin Draghici, Thiery De Pauw

Journal:

Neural Processing Letters

Year:

1999

Language:

english

File:

PDF, 110 KB

english, 1999

5

VLSI implementations of threshold logic- a comprehensive survey

Beiu, V., Quintana, J.M., Avedillo, M.J.

Journal:

IEEE Transactions on Neural Networks

Year:

2003

Language:

english

File:

PDF, 1.00 MB

english, 2003

6

[IEEE 2013 IEEE 20th International Conference on Electronics, Circuits, and Systems (ICECS) - Abu Dhabi, United Arab Emirates (2013.12.8-2013.12.11)] 2013 IEEE 20th International Conference on Electronics, Circuits, and Systems (ICECS) - On Schmitt trigger and other inverters

Ibrahim, Walid, Beiu, Valeriu, Tache, Mihai, Kharbash, Fekri

Year:

2013

Language:

english

File:

PDF, 1.09 MB

english, 2013

7

[IEEE Proceedings. 15th IEEE International Conference on Application-Specific Systems, Architectures and Processors, 2004. - Galveston, TX, USA (27-29 Sept. 2004)] Proceedings. 15th IEEE International Conference on Application-Specific Systems, Architectures and Processors, 2004. - A novel highly reliable low-power nano architecture when von neumann augments kolmogorov

Year:

2004

Language:

english

File:

PDF, 1.69 MB

english, 2004

8

Devices and Input Vectors are Shaping von Neumann Multiplexing

Beiu, Valeriu, Ibrahim, Walid

Journal:

IEEE Transactions on Nanotechnology

Year:

2011

Language:

english

File:

PDF, 1.32 MB

english, 2011

9

[IEEE 2007 2nd International Design and Test Workshop - Cairo, Egypt (2007.12.16-2007.12.18)] 2007 2nd International Design and Test Workshop - Proxels for Reliability Assessment of Future Nano-Architectures

Lazarova-Molnar, Sanja, Beiu, Valeriu, Ibrahim, Walid

Year:

2007

Language:

english

File:

PDF, 2.26 MB

english, 2007

10

[IEEE 2008 IEEE International Symposium on Circuits and Systems - ISCAS 2008 - Seattle, WA, USA (2008.05.18-2008.05.21)] 2008 IEEE International Symposium on Circuits and Systems - Does the brain really outperform Rent’s rule?

Beiu, Valeriu, Ibrahim, Walid

Year:

2008

Language:

english

File:

PDF, 250 KB

english, 2008

11

[IEEE 2010 5th International Design and Test Workshop (IDT) - Abu Dhabi, United Arab Emirates (2010.12.14-2010.12.15)] 2010 5th International Design and Test Workshop - On NOR-2 von Neumann multiplexing

Ibrahim, Walid, Beiu, Valeriu, Beg, Azam

Year:

2010

Language:

english

File:

PDF, 2.45 MB

english, 2010

12

[IEEE 2008 International Conference on Embedded Computer Systems: Architectures, Modeling, and Simulation (SAMOS) - Samos, Greece (2008.07.21-2008.07.24)] 2008 International Conference on Embedded Computer Systems: Architectures, Modeling, and Simulation - On brain-inspired hybrid topologies for nano-architectures - a Rent’s rule approach -

Beiu, Valeriu, Madappuram, Basheer A. M., McGinnity, Martin

Year:

2008

Language:

english

File:

PDF, 9.10 MB

english, 2008

13

[IEEE 2004 IEEE International Symposium on Circuits and Systems - Vancouver, BC, Canada (23-26 May 2004)] 2004 IEEE International Symposium on Circuits and Systems (IEEE Cat. No.04CH37512) - Characterization of a 16-bit threshold logic single-electron technology adder

Sulieman, M., Beiu, V.

Year:

2004

Language:

english

File:

PDF, 256 KB

english, 2004

14

[IEEE 2003 International Joint Conference on Neural Networks - Portland, OR, USA (20-24 July 2003)] Proceedings of the International Joint Conference on Neural Networks, 2003. - A survey of perceptron circuit complexity results

Year:

2003

Language:

english

File:

PDF, 497 KB

english, 2003

15

[IEEE 2003 46th Midwest Symposium on Circuits and Systems - Cairo, Egypt (27-30 Dec. 2003)] 2003 46th Midwest Symposium on Circuits and Systems - Threshold logic: From vacuum tubes to nanoelectronics; Invited Paper

Beiu, V., Quintana, J.M., Avedillo, M.J., Sulieman, M.

Year:

2003

Language:

english

File:

PDF, 2.08 MB

english, 2003

16

[IEEE 2017 12th International Conference on Design & Technology of Integrated Systems In Nanoscale Era (DTIS) - Palma de Mallorca, Spain (2017.4.4-2017.4.6)] 2017 12th International Conference on Design & Technology of Integrated Systems In Nanoscale Era (DTIS) - On hammock networks - sixty years after

Cowell, Simon Robin, Daus, Leonard, Beiu, Valeriu, Poulin, Philippe

Year:

2017

Language:

english

File:

PDF, 3.29 MB

english, 2017

17

[IEEE 2017 14th International Conference on Engineering of Modern Electric Systems (EMES) - Oradea, Romania (2017.6.1-2017.6.2)] 2017 14th International Conference on Engineering of Modern Electric Systems (EMES) - Transport reliability on axonal cytoskeleton

Beiu, Valeriu, Rohatinovici, Noemi Clara, Daus, Leonard, Balas, Valentina Emilia

Year:

2017

Language:

english

File:

PDF, 15.04 MB

english, 2017

18

[IEEE 2017 5th International Symposium on Electrical and Electronics Engineering (ISEEE) - Galati (2017.10.20-2017.10.22)] 2017 5th International Symposium on Electrical and Electronics Engineering (ISEEE) - Power quality in relation to the requirements of electromagnetic compatibility

Beiu, Constantin, Golovanov, Nicolae, Porumb, Radu, Toader, Cornel, Buica, Georgeta

Year:

2017

Language:

english

File:

PDF, 742 KB

english, 2017

19

The Impact Of Occupational Hazards In Workplaces - Maintenance, A Main Target For Ensuring The Safety Of Working Equipment

Antonov, Anca Elena, Buica, Georgeta, Darabont, Doru Costin, Beiu, Constantin

Journal:

ACTA Universitatis Cibiniensis

Year:

2015

Language:

english

File:

PDF, 518 KB

english, 2015

20

[IEEE 2018 7th International Conference on Computers Communications and Control (ICCCC) - Oradea, Romania (2018.5.8-2018.5.12)] 2018 7th International Conference on Computers Communications and Control (ICCCC) - Are 3D Fibonacci spirals for real?: From science to arts and back to science

Nagy, Mariana, Cowell, Simon R., Beiu, Valeriu

Year:

2018

Language:

english

File:

PDF, 586 KB

english, 2018

21

Nanosystems for Improved Targeted Therapies in Melanoma

Beiu,, Giurcaneanu,, Grumezescu,, Holban,, Popa,, Mihai,

Journal:

Journal of Clinical Medicine

Year:

2020

File:

PDF, 750 KB

2020

22

Deeper Sparsely Nets can be Optimal

Valeriu Beiu, Hanna E. Makaruk

Journal:

Neural Processing Letters

Year:

1998

Language:

english

File:

PDF, 280 KB

english, 1998

23

On the circuit and VLSI complexity of threshold gate comparison

Journal:

Year:

1998

Language:

english

File:

PDF, 323 KB

english, 1998

24

GREDA: A Fast and More Accurate Gate Reliability EDA Tool

Ibrahim, W., Beiu, V., Beg, A.

Journal:

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

Year:

2012

Language:

english

File:

PDF, 2.34 MB

english, 2012

25

Using Bayesian Networks to Accurately Calculate the Reliability of Complementary Metal Oxide Semiconductor Gates

Ibrahim, W., Beiu, V.

Journal:

IEEE Transactions on Reliability

Year:

2011

Language:

english

File:

PDF, 1.05 MB

english, 2011

26

Optimized birefringence changes during isolated nerve activation

Foust, Amanda J., Beiu, Roxana M., Rector, David M.

Journal:

Year:

2005

Language:

english

File:

PDF, 345 KB

english, 2005

27

[IEEE 2003 46th Midwest Symposium on Circuits and Systems - Cairo, Egypt (27-30 Dec. 2003)] 2003 46th Midwest Symposium on Circuits and Systems - Review of recent full adders implemenetd in single electron technology; Invited Paper

Sulieman, M., Beiu, V.

Year:

2003

Language:

english

File:

PDF, 770 KB

english, 2003

28

AIP Conference Proceedings [AIP NUMERICAL ANALYSIS AND APPLIED MATHEMATICS ICNAAM 2012: International Conference of Numerical Analysis and Applied Mathematics - Kos, Greece (19–25 September 2012)] - Aspects of computing with locally connected networks

Beiu, V., Calame, M., Cuniberti, G., Gamrat, C., Konkoli, Z., Vuillaume, D., Wendin, G., Yitzchaik, S.

Year:

2012

Language:

english

File:

PDF, 857 KB

english, 2012

29

[Lecture Notes of the Institute for Computer Sciences, Social Informatics and Telecommunications Engineering] Nano-Net Volume 20 || Organic Memristors and Adaptive Networks

Schmid, Alexandre, Goel, Sanjay, Wang, Wei, Beiu, Valeriu, Carrara, Sandro

Year:

2009

Language:

english

File:

PDF, 475 KB

english, 2009

30

[IEEE 2011 IEEE 11th International Conference on Nanotechnology (IEEE-NANO) - Portland, OR, USA (2011.08.15-2011.08.18)] 2011 11th IEEE International Conference on Nanotechnology - Highly reliable and low-power full adder cell

Ibrahim, Walid, Beg, Azam, Beiu, Valeriu

Year:

2011

Language:

english

File:

PDF, 763 KB

english, 2011

31

Threshold Voltage Variations Make Full Adders Reliabilities Similar

Ibrahim, Walid, Beiu, Valeriu

Journal:

IEEE Transactions on Nanotechnology

Year:

2010

Language:

english

File:

PDF, 287 KB

english, 2010

32

[Lecture Notes of the Institute for Computer Sciences, Social Informatics and Telecommunications Engineering] Nano-Net Volume 20 || Nanoelectrochemical Immunosensors for Protein Detection

Schmid, Alexandre, Goel, Sanjay, Wang, Wei, Beiu, Valeriu, Carrara, Sandro

Year:

2009

Language:

english

File:

PDF, 437 KB

english, 2009

33

[IEEE 2013 14th International Symposium on Quality Electronic Design (ISQED 2013) - Santa Clara, CA (2013.3.4-2013.3.6)] International Symposium on Quality Electronic Design (ISQED) - Enabling sizing for enhancing the static noise margins

Beiu, V., Beg, A., Ibrahim, W., Kharbash, F., Alioto, M.

Year:

2013

Language:

english

File:

PDF, 410 KB

english, 2013

34

On the Reliability of Majority Gates Full Adders

W. Ibrahim, V. Beiu, M. H. Sulieman

Journal:

IEEE Transactions on Nanotechnology

Year:

2008

Language:

english

File:

PDF, 1.07 MB

english, 2008

35

Optimum Reliability Sizing for Complementary Metal Oxide Semiconductor Gates

Ibrahim, W., Beiu, V., Beg, A.

Journal:

IEEE Transactions on Reliability

Year:

2012

Language:

english

File:

PDF, 2.32 MB

english, 2012

36

[IEEE 2011 IEEE 9th International New Circuits and Systems Conference (NEWCAS 2011) - Bordeaux (2011.06.26-2011.06.29)] 2011 IEEE 9th International New Circuits and systems conference - Atto Joule CMOS gates using reversed sizing and W/L swapping

Beg, Azam, Beiu, Valeriu, Ibrahim, Walid

Year:

2011

Language:

english

File:

PDF, 157 KB

english, 2011

37

[IEEE 2011 IEEE 11th International Conference on Nanotechnology (IEEE-NANO) - Portland, OR, USA (2011.08.15-2011.08.18)] 2011 11th IEEE International Conference on Nanotechnology - Atto-Joule gates for the whole voltage range

Beiu, Valeriu, Beg, Azam, Ibrahim, Walid

Year:

2011

Language:

english

File:

PDF, 315 KB

english, 2011

38

[IEEE 4th IEEE Conference on Nanotechnology, 2004. - Munich, Germany (16-19 Aug. 2004)] 4th IEEE Conference on Nanotechnology, 2004. - On nanoelectronic architectural challenges and solutions

Beiu, V., Rfickert, U., Roy, S., Nyathi, J.

Year:

2004

Language:

english

File:

PDF, 356 KB

english, 2004

39

[IEEE Comput. Soc. Press Proceedings. VLSI and Computer Peripherals. COMPEURO 89 - Hamburg, West Germany (8-12 May 1989)] Proceedings. VLSI and Computer Peripherals. COMPEURO 89 - Considerations of vision based on associative neural networks

Beiu, V.C., Georgescu, S.

Year:

1989

Language:

english

File:

PDF, 348 KB

english, 1989

40

[IEEE SCS 2003. International Symposium on Signals, Circuits and Systems - Iasi, Romania (10-11 July 2003)] SCS 2003. International Symposium on Signals, Circuits and Systems. Proceedings (Cat. No.03EX720) - Differential implementations of threshold logic gates

Beiu, V., Quintana, J.M., Avedilo, M.J., Andonie, R.

Year:

2003

Language:

english

File:

PDF, 303 KB

english, 2003

41

[IEEE 15th Biennial University/Government/Industry Microelectronics Symposium - Boise, ID, USA (30 June-2 July 2003)] Proceedings of the 15th Biennial University/Government/ Industry Microelectronics Symposium (Cat. No.03CH37488) - High performance direct digital frequency synthesizers

Zhihe Zhou,, Betowski, D., Xuan Li,, La Rue, G., Beiu, V.

Year:

2003

Language:

english

File:

PDF, 143 KB

english, 2003

42

[IEEE Comput. Soc 5th Brazilian Symposium on Neural Networks - Belo Horizonte, Brazil (9-11 Dec. 1998)] Proceedings 5th Brazilian Symposium on Neural Networks (Cat. No.98EX209) - On Kolmogorov's superpositions and Boolean functions

Year:

1998

Language:

english

File:

PDF, 79 KB

english, 1998

43

[IEEE 2005 IEEE International Joint Conference on Neural Networks, 2005. - MOntreal, QC, Canada (July 31-Aug. 4, 2005)] Proceedings. 2005 IEEE International Joint Conference on Neural Networks, 2005. - Ultra low power fault tolerant neural inspired CMOS logic

Aunet, S., Beiu, V.

Year:

2005

Language:

english

File:

PDF, 2.07 MB

english, 2005

44

[IEEE 2007 IEEE International Conf. on Application-specific Systems, Architectures and Processors - Montreal, QC, Canada (2007.07.9-2007.07.11)] 2007 IEEE International Conf. on Application-specific Systems, Architectures and Processors (ASAP) - Long Live Small Fan-in Majority Gates Their Reign Looks Like Coming!

Ibrahim, Walid, Beiu, Valeriu

Year:

2007

Language:

english

File:

PDF, 832 KB

english, 2007

45

[IEEE 2013 7th IEEE GCC Conference and Exhibition (GCC) - Doha, Qatar (2013.11.17-2013.11.20)] 2013 7th IEEE GCC Conference and Exhibition (GCC) - Monte Carlo analysis of the static noise margins for CMOS gates in predictive technology models

Acharya, N. V., Raju, J. L., Kumar, A., Tache, M., Beiu, V.

Year:

2013

Language:

english

File:

PDF, 836 KB

english, 2013

46

[IEEE 37th International Symposium on Multiple-Valued Logic - Oslo, Norway (2007.05.13-2007.05.16)] 37th International Symposium on Multiple-Valued Logic (ISMVL'07) - Grand Challenges of Nanoelectronics and Possible Architectural Solutions: What Do Shannon, von Neumann, Kolmogorov, and Feynman Have to do with Moore

Year:

2007

Language:

english

File:

PDF, 595 KB

english, 2007

47

[IEEE 4th IEEE Conference on Nanotechnology, 2004. - Munich, Germany (16-19 Aug. 2004)] 4th IEEE Conference on Nanotechnology, 2004. - On single electron technology full adders

Sulieman, M., Beiu, V.

Year:

2004

Language:

english

File:

PDF, 284 KB

english, 2004

48

[IEEE 2013 E-Health and Bioengineering Conference (EHB) - IASI, Romania (2013.11.21-2013.11.23)] 2013 E-Health and Bioengineering Conference (EHB) - Probabilistic gate matrix for axon-inspired communication

Arotaritei, Dragos, Turnea, Marius, Beiu, Valeriu, Rotariu, Mariana

Year:

2013

Language:

english

File:

PDF, 624 KB

english, 2013

49

[IEEE 2007 Innovations in Information Technologies (IIT) - Dubai, United Arab Emirates (2007.11.18-2007.11.20)] 2007 Innovations in Information Technologies (IIT) - On the Reliability of Four Full Adder Cells

Ibrahim, W., Beiu, V., Alkhawwar, Y. A.

Year:

2007

Language:

english

File:

PDF, 2.02 MB

english, 2007

50

Serial Addition: Locally Connected Architectures

Beiu, Valeriu, Aunet, Snorre, Nyathi, Jabulani, Rydberg, Robert R., Ibrahim, Walid

Journal:

IEEE Transactions on Circuits and Systems I: Regular Papers

Year:

2007

Language:

english

File:

PDF, 2.55 MB

english, 2007

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